Nanometrics 210 Thin Film Measurement Tool - Tools - By Dealer
- 3200.00 £
- Published date: April 18, 2024
-
- Todwick, South Yorkshire, United Kingdom
Nanometrics 210 Thin Film Measurement Tool - Tools - By Dealer
⭕ Nanometrics 210 Thin Film Measurement Tool
480-850 nm reflection spectrum
Designed for silicon substrates; others allowed, but accuracy not guaranteed
150 A to tens of microns thickness measurements
Objectives of 5x, 10x, and 20x for 40 um, 20 um, and 10 um spot sizes.; can measure film properties in small areas
Thicker films require lower objective magnification due to depth of focus
Programs for photoresist, SiO2, SiN on silicon
Will ship
480-850 nm reflection spectrum
Designed for silicon substrates; others allowed, but accuracy not guaranteed
150 A to tens of microns thickness measurements
Objectives of 5x, 10x, and 20x for 40 um, 20 um, and 10 um spot sizes.; can measure film properties in small areas
Thicker films require lower objective magnification due to depth of focus
Programs for photoresist, SiO2, SiN on silicon
Will ship
Phone number ✆ 0114 875 9531
Todwick, South Yorkshire
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