JEOL JSM-6701F SEM Scanning Electron Microscope

  • 47000.00 £
  • Published date: August 18, 2018
    • Ixworth, Suffolk, United Kingdom

JEOL JSM-6701F SEM Scanning Electron Microscope


⭕ JEOL JSM-6701F Ultra High Resolution FE SEM Microscope, Year 2012
Clean condition, has been checked, tested and everything works as per manufacturer specs. Can assist with delivery.
The JSM-6701F is an ultra high resolution FE SEM suitable for observations of fine structures such as multi-layered film and nano particles fabricated by the nano technology. JEOL JSM-6701F SEM (field-emission) equipped with cold field emission electron source with magnification from 25 to 650,000 times and accelerating voltage from 0.5 kV to 30 kV. Secondary electron detectors, retractable backscattered electron detector and transmission electron detector are available. Comes with the following:

Oxford X-Max 80 SDD detector
SM-34080 (LDD) Lower Detector (lower SEI detector, in addition to the standard in-lens detector)
SM-71510 Specimen exchange chamber type 1A
SM-74120 (LNT) Liquid Nitrogen Trap
SM-33010 (PVG) Penning Vacuum Gauge
SM-71520MSC ( motorized stage controller)
software, manuals, sampler holders
Oil Rotary Pump
Water Chiller

Phone number ✆ 01473 544292
Ixworth, Suffolk




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