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Nanometrics 210 Thin Film Measurement Tool

  • 3200.00 £
  • Published date: April 19, 2024
    • Barnard Castle, Durham, United Kingdom

Nanometrics 210 Thin Film Measurement Tool


⭕ Nanometrics 210 Thin Film Measurement Tool
480-850 nm reflection spectrum
Designed for silicon substrates; others allowed, but accuracy not guaranteed
150 A to tens of microns thickness measurements
Objectives of 5x, 10x, and 20x for 40 um, 20 um, and 10 um spot sizes.; can measure film properties in small areas
Thicker films require lower objective magnification due to depth of focus
Programs for photoresist, SiO2, SiN on silicon
Excellent condition, Perfect working order
Available for shipping/pickup

Phone number ✆ 0191 415 5774
Barnard Castle, Durham

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